High Quality Test Pattern Generation and Boolean Satisfiability

This book provides an overview of automatic test pattern generation (ATPG) and introduces novel techniques to complement classical ATPG, based on Boolean Satisfiability (SAT).  A fast and highly fault efficient SAT-based ATPG framework is presented which is also able to generate high-quality delay t...

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Detalles Bibliográficos
Clasificación:Libro Electrónico
Autores principales: Eggersglüß, Stephan (Autor), Drechsler, Rolf (Autor)
Autor Corporativo: SpringerLink (Online service)
Formato: Electrónico eBook
Idioma:Inglés
Publicado: New York, NY : Springer New York : Imprint: Springer, 2012.
Edición:1st ed. 2012.
Temas:
Electronic circuits.
Electronics.
Microprocessors.
Computer architecture.
Electronic Circuits and Systems.
Electronics and Microelectronics, Instrumentation.
Processor Architectures.
Acceso en línea:Texto Completo
Tabla de Contenidos:
  • Part I: Preliminaries and Previous Work
  • Circuits and Testing
  • Boolean Satisfiability
  • ATPG Based on Boolean Satisfiability
  • Part II: New SAT Techniques and their Application in ATPG
  • Dynamic Clause Activation
  • Circuit-based Dynamic Learning
  • Part III: High Quality Delay Test Generation
  • High Quality ATPG for Transition Faults
  • Path Delay Fault Model
  • Summary and Outlook.

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