Microelectronic Test Structures for CMOS Technology
Microelectronic Test Structures for CMOS Technology and Products addresses the basic concepts of the design of test structures for incorporation within test-vehicles, scribe-lines, and CMOS products. The role of test structures in the development and monitoring of CMOS technologies and products has...
Clasificación: | Libro Electrónico |
---|---|
Autores principales: | Bhushan, Manjul (Autor), Ketchen, Mark B. (Autor) |
Autor Corporativo: | SpringerLink (Online service) |
Formato: | Electrónico eBook |
Idioma: | Inglés |
Publicado: |
New York, NY :
Springer New York : Imprint: Springer,
2011.
|
Edición: | 1st ed. 2011. |
Temas: | |
Acceso en línea: | Texto Completo |
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