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Test and Diagnosis for Small-Delay Defects
This book introduces new techniques for detecting and diagnosing small-delay defects (SDD) in integrated circuits. Although this sort of timing defect is commonly found in integrated circuits manufactured with nanometer technology, this will be the first book to introduce effective and scalable meth...
| Clasificación: | Libro Electrónico |
|---|---|
| Autores principales: | , , |
| Autor Corporativo: | |
| Formato: | Electrónico eBook |
| Idioma: | Inglés |
| Publicado: |
New York, NY :
Springer New York : Imprint: Springer,
2012.
|
| Edición: | 1st ed. 2012. |
| Temas: | |
| Acceso en línea: | Texto Completo |
Tabla de Contenidos:
- Introduction to VLSI Testing
- Delay Test and System-Delay Defects
- Long Path-Based Hybrid Method
- Process Variations- and Crosstalk-Aware Pattern Selection
- Power Supply Noise- and Crosstalk-Aware Hybrid Method
- SDD-Based Hybrid Method
- Maximizing Crosstalk Effect on Critical Paths
- Maximizing Power Supply Noise on Critical Paths
- Faster-than-at-speed Test
- Introduction to Diagnosis
- Diagnosing Noise-Induced SDDs by Using Dynamic SDF. .