Scanning Probe Microscopy of Functional Materials Nanoscale Imaging and Spectroscopy /
Novel scanning probe microscopy (SPM) techniques are used for the characterization of local materials functionalities ranging from chemical reactivity and composition to mechanical, electromechanical, and transport behaviors. In this comprehensive overview, special emphasis is placed on emerging app...
Clasificación: | Libro Electrónico |
---|---|
Autor Corporativo: | SpringerLink (Online service) |
Otros Autores: | Kalinin, Sergei V. (Editor ), Gruverman, Alexei (Editor ) |
Formato: | Electrónico eBook |
Idioma: | Inglés |
Publicado: |
New York, NY :
Springer New York : Imprint: Springer,
2011.
|
Edición: | 1st ed. 2011. |
Temas: | |
Acceso en línea: | Texto Completo |
Ejemplares similares
-
Scanning Probe Microscopy Electrical and Electromechanical Phenomena at the Nanoscale /
por: Kalinin, Sergei V., et al.
Publicado: (2007) -
Atom Probe Microscopy
por: Gault, Baptiste, et al.
Publicado: (2012) -
Scanning Probe Microscopy Atomic Scale Engineering by Forces and Currents /
por: Foster, Adam, et al.
Publicado: (2006) -
Acoustic Scanning Probe Microscopy
Publicado: (2013) -
Handbook of Sample Preparation for Scanning Electron Microscopy and X-Ray Microanalysis
por: Echlin, Patrick
Publicado: (2009)