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Extreme Statistics in Nanoscale Memory Design
Extreme Statistics in Nanoscale Memory Design brings together some of the world's leading experts in statistical EDA, memory design, device variability modeling and reliability modeling, to compile theoretical and practical results in one complete reference on statistical techniques for extreme...
| Clasificación: | Libro Electrónico |
|---|---|
| Autor Corporativo: | |
| Otros Autores: | , |
| Formato: | Electrónico eBook |
| Idioma: | Inglés |
| Publicado: |
New York, NY :
Springer US : Imprint: Springer,
2010.
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| Edición: | 1st ed. 2010. |
| Colección: | Integrated Circuits and Systems,
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| Temas: | |
| Acceso en línea: | Texto Completo |
Tabla de Contenidos:
- Extreme Statistics in Memories
- Statistical Nano CMOS Variability and Its Impact on SRAM
- Importance Sampling-Based Estimation: Applications to Memory Design
- Direct SRAM Operation Margin Computation with Random Skews of Device Characteristics
- Yield Estimation by Computing Probabilistic Hypervolumes
- Most Probable Point-Based Methods
- Extreme Value Theory: Application to Memory Statistics.