Advanced Computing in Electron Microscopy

Advanced Computing in Electron Microscopy, 2nd Edition, brings together diverse information on image simulation. An invaluable resource, this book provides information on various methods for numerical computation of high resolution conventional and scanning transmission electron microscope images. T...

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Detalles Bibliográficos
Clasificación:Libro Electrónico
Autor principal: Kirkland, Earl J. (Autor)
Autor Corporativo: SpringerLink (Online service)
Formato: Electrónico eBook
Idioma:Inglés
Publicado: New York, NY : Springer US : Imprint: Springer, 2010.
Edición:2nd ed. 2010.
Temas:
Spectrum analysis.
Electrical engineering.
Materials-Analysis.
Numerical analysis.
Spectroscopy.
Electrical and Electronic Engineering.
Characterization and Analytical Technique.
Numerical Analysis.
Acceso en línea:Texto Completo
Tabla de Contenidos:
  • The Transmission Electron Microscope
  • Linear Image Approximations
  • Sampling and the Fast Fourier Transform
  • Calculation of Images of Thin Specimens
  • Theory of Calculation of Images of Thick Specimens
  • Multislice Applications and Examples
  • The Programs
  • Plotting Transfer Functions
  • The Fourier Projection Theorem
  • Atomic Potentials and Scattering Factors
  • Bilinear Interpolation
  • 3D Perspective View.

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