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Advanced Computing in Electron Microscopy
Advanced Computing in Electron Microscopy, 2nd Edition, brings together diverse information on image simulation. An invaluable resource, this book provides information on various methods for numerical computation of high resolution conventional and scanning transmission electron microscope images. T...
| Clasificación: | Libro Electrónico |
|---|---|
| Autor principal: | |
| Autor Corporativo: | |
| Formato: | Electrónico eBook |
| Idioma: | Inglés |
| Publicado: |
New York, NY :
Springer US : Imprint: Springer,
2010.
|
| Edición: | 2nd ed. 2010. |
| Temas: | |
| Acceso en línea: | Texto Completo |
MARC
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| 100 | 1 | |a Kirkland, Earl J. |e author. |4 aut |4 http://id.loc.gov/vocabulary/relators/aut | |
| 245 | 1 | 0 | |a Advanced Computing in Electron Microscopy |h [electronic resource] / |c by Earl J. Kirkland. |
| 250 | |a 2nd ed. 2010. | ||
| 264 | 1 | |a New York, NY : |b Springer US : |b Imprint: Springer, |c 2010. | |
| 300 | |a X, 289 p. |b online resource. | ||
| 336 | |a text |b txt |2 rdacontent | ||
| 337 | |a computer |b c |2 rdamedia | ||
| 338 | |a online resource |b cr |2 rdacarrier | ||
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| 505 | 0 | |a The Transmission Electron Microscope -- Linear Image Approximations -- Sampling and the Fast Fourier Transform -- Calculation of Images of Thin Specimens -- Theory of Calculation of Images of Thick Specimens -- Multislice Applications and Examples -- The Programs -- Plotting Transfer Functions -- The Fourier Projection Theorem -- Atomic Potentials and Scattering Factors -- Bilinear Interpolation -- 3D Perspective View. | |
| 520 | |a Advanced Computing in Electron Microscopy, 2nd Edition, brings together diverse information on image simulation. An invaluable resource, this book provides information on various methods for numerical computation of high resolution conventional and scanning transmission electron microscope images. This text will serve as a great tool for students at the advanced undergraduate or graduate level, as well as experienced researchers in the field. This enhanced second edition includes: -descriptions of new developments in the field -updated references -additional material on aberration corrected instruments and confocal electron microscopy -expanded and improved examples and sections to provide stronger clarity. | ||
| 650 | 0 | |a Spectrum analysis. | |
| 650 | 0 | |a Electrical engineering. | |
| 650 | 0 | |a Materials-Analysis. | |
| 650 | 0 | |a Numerical analysis. | |
| 650 | 1 | 4 | |a Spectroscopy. |
| 650 | 2 | 4 | |a Electrical and Electronic Engineering. |
| 650 | 2 | 4 | |a Characterization and Analytical Technique. |
| 650 | 2 | 4 | |a Numerical Analysis. |
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| 773 | 0 | |t Springer Nature eBook | |
| 776 | 0 | 8 | |i Printed edition: |z 9781441965325 |
| 776 | 0 | 8 | |i Printed edition: |z 9781489995094 |
| 776 | 0 | 8 | |i Printed edition: |z 9781441965349 |
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| 950 | |a Physics and Astronomy (SpringerNature-11651) | ||
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