Reliability of Nanoscale Circuits and Systems Methodologies and Circuit Architectures /

Reliability of Nanoscale Circuits and Systems: Methodologies and Circuit Architectures Milos Stanisavljevic Alexandre Schmid Yusuf Leblebici Future integrated circuits are expected to be made of emerging nanodevices and their associated interconnects, but the reliability of such components is a majo...

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Detalles Bibliográficos
Clasificación:Libro Electrónico
Autores principales: Stanisavljević, Miloš (Autor), Schmid, Alexandre (Autor), Leblebici, Yusuf (Autor)
Autor Corporativo: SpringerLink (Online service)
Formato: Electrónico eBook
Idioma:Inglés
Publicado: New York, NY : Springer New York : Imprint: Springer, 2011.
Edición:1st ed. 2011.
Temas:
Electronic circuits.
Security systems.
Computer-aided engineering.
Electronic Circuits and Systems.
Security Science and Technology.
Computer-Aided Engineering (CAD, CAE) and Design.
Acceso en línea:Texto Completo
Tabla de Contenidos:
  • Introduction
  • Reliability, Faults and Fault Models
  • Nanotechnology and Nanodevices
  • Fault-Tolerant Architectures and Approaches
  • Reliability Evaluation Techniques
  • Averaging Design Implementations
  • Statistical Evaluation of Fault-Tolerance Using Proability Density Functions
  • System Level Reliability Evaluation and Optimization
  • Summary and Conclusions
  • References.

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