Advanced Test Methods for SRAMs Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies /

Advanced Test Methods for SRAMs: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies by: Alberto Bosio Luigi Dilillo Patrick Girard Serge Pravossoudovitch Arnaud Virazel Modern electronics depends on nanoscaled technologies that present new challenges in terms of testing and d...

Descripción completa

Detalles Bibliográficos
Clasificación:Libro Electrónico
Autores principales: Bosio, Alberto (Autor), Dilillo, Luigi (Autor), Girard, Patrick (Autor), Pravossoudovitch, Serge (Autor), Virazel, Arnaud (Autor)
Autor Corporativo: SpringerLink (Online service)
Formato: Electrónico eBook
Idioma:Inglés
Publicado: New York, NY : Springer US : Imprint: Springer, 2010.
Edición:1st ed. 2010.
Temas:
Electronic circuits.
Computer-aided engineering.
Electronic Circuits and Systems.
Computer-Aided Engineering (CAD, CAE) and Design.
Acceso en línea:Texto Completo
Tabla de Contenidos:
  • Basics on SRAM Testing
  • Resistive-Open Defects in Core-Cells
  • Resistive-Open Defects in Pre-charge Circuits
  • Resistive-Open Defects in Address Decoders
  • Resistive-Open Defects in Write Drivers
  • Resistive-Open Defects in Sense Amplifiers
  • Faults Due to Process Variations in SRAMs
  • Diagnosis and Design-for-Diagnosis.

Ejemplares similares