Advanced Test Methods for SRAMs Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies /

Advanced Test Methods for SRAMs: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies by: Alberto Bosio Luigi Dilillo Patrick Girard Serge Pravossoudovitch Arnaud Virazel Modern electronics depends on nanoscaled technologies that present new challenges in terms of testing and d...

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Detalles Bibliográficos
Clasificación:Libro Electrónico
Autores principales: Bosio, Alberto (Autor), Dilillo, Luigi (Autor), Girard, Patrick (Autor), Pravossoudovitch, Serge (Autor), Virazel, Arnaud (Autor)
Autor Corporativo: SpringerLink (Online service)
Formato: Electrónico eBook
Idioma:Inglés
Publicado: New York, NY : Springer US : Imprint: Springer, 2010.
Edición:1st ed. 2010.
Temas:
Electronic circuits.
Computer-aided engineering.
Electronic Circuits and Systems.
Computer-Aided Engineering (CAD, CAE) and Design.
Acceso en línea:Texto Completo

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