Power-Aware Testing and Test Strategies for Low Power Devices

Power-Aware Testing and Test Strategies for Low-Power Devices Edited by: Patrick Girard, Research Director, CNRS / LIRMM, France Nicola Nicolici, Associate Professor, McMaster University, Canada Xiaoqing Wen, Professor, Kyushu Institute of Technology, Japan Managing the power consumption of circuits...

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Detalles Bibliográficos
Clasificación:Libro Electrónico
Autor Corporativo: SpringerLink (Online service)
Otros Autores: Girard, Patrick (Editor ), Nicolici, Nicola (Editor ), Wen, Xiaoqing (Editor )
Formato: Electrónico eBook
Idioma:Inglés
Publicado: New York, NY : Springer US : Imprint: Springer, 2010.
Edición:1st ed. 2010.
Temas:
Electronic circuits.
Computer-aided engineering.
Electronic Circuits and Systems.
Computer-Aided Engineering (CAD, CAE) and Design.
Acceso en línea:Texto Completo
Tabla de Contenidos:
  • Fundamentals of VLSI Testing
  • Power Issues During Test
  • Low-Power Test Pattern Generation
  • Power-Aware Design-for-Test
  • Power-Aware Test Data Compression and BIST
  • Power-Aware System-Level Test Planning
  • Low-Power Design Techniques and Test Implications
  • Test Strategies for Multivoltage Designs
  • Test Strategies for Gated Clock Designs
  • Test of Power Management Structures
  • EDA Solution for Power-Aware Design-for-Test.

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