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Functional Design Errors in Digital Circuits Diagnosis Correction and Repair /

Due to the dramatic increase in design complexity, modern circuits are often produced with functional errors. While improvements in verification allow engineers to find more errors, fixing these errors remains a manual and challenging task. Functional Design Errors in Digital Circuits Diagnosis cove...

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Detalles Bibliográficos
Clasificación:Libro Electrónico
Autores principales: Chang, Kai-hui (Autor), Markov, Igor L. (Autor), Bertacco, Valeria (Autor)
Autor Corporativo: SpringerLink (Online service)
Formato: Electrónico eBook
Idioma:Inglés
Publicado: Dordrecht : Springer Netherlands : Imprint: Springer, 2009.
Edición:1st ed. 2009.
Colección:Lecture Notes in Electrical Engineering, 32
Temas:
Acceso en línea:Texto Completo

MARC

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245 1 0 |a Functional Design Errors in Digital Circuits  |h [electronic resource] :  |b Diagnosis Correction and Repair /  |c by Kai-hui Chang, Igor L. Markov, Valeria Bertacco. 
250 |a 1st ed. 2009. 
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490 1 |a Lecture Notes in Electrical Engineering,  |x 1876-1119 ;  |v 32 
505 0 |a Background and Prior Art -- Current Landscape in Design and Verification -- Finding Bugs and Repairing Circuits -- FogClear Methodologies and Theoretical Advances in Error Repair -- Circuit Design and Verification Methodologies -- Counterexample-Guided Error-Repair Framework -- Signature-Based Resynthesis Techniques -- Symmetry-Based Rewiring -- FogClear Components -- Bug Trace Minimization -- Functional Error Diagnosis and Correction -- Incremental Verification for Physical Synthesis -- Post-Silicon Debugging and Layout Repair -- Methodologies for Spare-Cell Insertion -- Conclusions. 
520 |a Due to the dramatic increase in design complexity, modern circuits are often produced with functional errors. While improvements in verification allow engineers to find more errors, fixing these errors remains a manual and challenging task. Functional Design Errors in Digital Circuits Diagnosis covers a wide spectrum of innovative methods to automate the debugging process throughout the design flow: from Register-Transfer Level (RTL) all the way to the silicon die. In particular, this book describes: (1) techniques for bug trace minimization that simplify debugging; (2) an RTL error diagnosis method that identifies the root cause of errors directly; (3) a counterexample-guided error-repair framework to automatically fix errors in gate-level and RTL designs; (4) a symmetry-based rewiring technology for fixing electrical errors; (5) an incremental verification system for physical synthesis; and (6) an integrated framework for post-silicon debugging and layout repair. In addition, Functional Design Errors in Digital Circuits Diagnosis describes a comprehensive evaluation of spare-cell insertion methods. The solutions provided in this book can greatly reduce debugging effort, enhance design quality, and ultimately enable the design and manufacture of more reliable electronic devices. 
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650 2 4 |a Logic Design. 
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