Microscopy of Semiconducting Materials 2007 Proceedings of the 15th Conference, 2-5 April 2007, Cambridge, UK /

The fifteenth international conference on Microscopy of Semiconducting Materials took place in Cambridge, UK on 2-5 April 2007. It was organised by the Institute of Physics, with co-sponsorship by the Royal Microscopical Society and endorsement by the Materials Research Society. The conference focus...

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Detalles Bibliográficos
Clasificación:Libro Electrónico
Autor Corporativo: SpringerLink (Online service)
Otros Autores: Cullis, A.G (Editor ), Midgley, P.A (Editor )
Formato: Electrónico eBook
Idioma:Inglés
Publicado: Dordrecht : Springer Netherlands : Imprint: Springer, 2008.
Edición:1st ed. 2008.
Colección:Springer Proceedings in Physics, 120
Temas:
Materials science.
Condensed matter.
Spectrum analysis.
Measurement.
Measuring instruments.
Electronics.
Materials Science.
Condensed Matter Physics.
Spectroscopy.
Measurement Science and Instrumentation.
Electronics and Microelectronics, Instrumentation.
Acceso en línea:Texto Completo
Tabla de Contenidos:
  • Wide Band-Gap Nitrides
  • General Heteroepitaxial Layers
  • High Resolution Microscopy and Nanoanalysis
  • Self-Organised and Quantum Domain Structures
  • Processed Silicon and Other Device Materials
  • Device and Doping Studies
  • FIB, SEM and SPM Advances.

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