Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials Proceedings of the NATO Advanced Study Institute on Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials, Algarve, Portugal, 1 - 13 October 2002 /

As the characteristic dimensions of electronic devices continue to shrink, the ability to characterize their electronic properties at the nanometer scale has come to be of outstanding importance. In this sense, Scanning Probe Microscopy (SPM) is becoming an indispensable tool, playing a key role in...

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Detalles Bibliográficos
Clasificación:Libro Electrónico
Autor Corporativo: SpringerLink (Online service)
Otros Autores: Vilarinho, Paula M. (Editor ), Rosenwaks, Yossi (Editor ), Kingon, Angus (Editor )
Formato: Electrónico eBook
Idioma:Inglés
Publicado: Dordrecht : Springer Netherlands : Imprint: Springer, 2005.
Edición:1st ed. 2005.
Colección:NATO Science Series II: Mathematics, Physics and Chemistry, Mathematics, Physics and Chemistry ; 186
Temas:
Condensed matter.
Optical materials.
Nanotechnology.
Surfaces (Technology).
Thin films.
Condensed Matter Physics.
Optical Materials.
Surfaces, Interfaces and Thin Film.
Acceso en línea:Texto Completo
Tabla de Contenidos:
  • Fundamentals of Functional Materials
  • Functional Materials: Properties, Processing and Applications
  • Scaling of Silicon-Based Devices to Submicron Dimensions
  • Unsolved Problems in Ferroelectrics for Scanning Probe Microscopy
  • Fundamentals of Scanning Probe Techniques
  • Principles of Basic and Advanced Scanning Probe Microscopy
  • Nanoscale Probing of Physical and Chemical Functionality with Near-Field Optical Microscopy
  • Nanoscale Electronic Measurements of Semiconductors Using Kelvin Probe Force Microscopy
  • Expanding the Capabilities of the Scanning Tunneling Microscope
  • Functions of NC-AFM on Atomic Scale
  • Application of Scanning Techniques to Functional Materials
  • Scanning Probe Microscopy of Piezoelectric and Transport Phenomena in Electroceramic Materials
  • SFM-Based Methods for Ferroelectric Studies
  • Scanning Tunneling Spectroscopy
  • Nanoinspection of Dielectric and Polarization Properties at Inner and Outer Interfaces in Functional Ferroelectric PZT Thin Films
  • Microscale Contact Charging on a Silicon Oxide
  • Constructive Nanolithography
  • Nanometer-Scale Electronics and Storage
  • Contributed papers
  • Stm Tips Fabrication for Critical Dimension Measurements
  • Scanning Probe Microscopy Characterization of Ferroelectrics Domains and Domains Walls in KTiOPO4
  • Imaging Local Dielectric and Mechanical Responses with Dynamic Heterodyned Electrostatic Force Microscopy
  • AFM Patterning of SrTiO3?? Thin Films and Device Applications
  • Nanoscale Investigation of a Rayleigh Wave on LiNbO3
  • Scanning Capacitance Force Microscopy and Kelvin Probe Force Microscopy of Nanostructures Embedded in SiO2
  • Electrical Characterisation of III-V Buried Heterostructure Lasers by Scanning Capacitance Microscopy
  • Probing the Density of States of High Temperature Superconductors with Point Contact Tunneling Spectroscopy
  • Annealing Influence on Co Ultrathin Film Morphology in MBE Grown Co/Au Bilayers
  • Correlation between the Surface Relief and Interfaces Structure of Fe/Cr Superlattices and Electromagnetic Waves Penetration
  • Magnetoresistance and Microstructure of Magnetic Thin Film Multilayers
  • SPM Investigation of Thiolated Gold Nanoparticle Patterns Deposited on Different Self-Assembled Substrates
  • AFM of Guanine Adsorbed on HOPG under Electrochemical Control
  • Dynamics in Model Membranes and DNA-Membrane Complexes Using Temperature Controlled Atomic Force Microscopy.

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