Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections

Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections provides a detailed description of the application of finite element methods (FEMs) to the study of ULSI interconnect reliability. Over the past two decades the application of FEMs has become widespread and conti...

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Detalles Bibliográficos
Clasificación:Libro Electrónico
Autores principales: Tan, Cher Ming (Autor), Li, Wei (Autor), Gan, Zhenghao (Autor), Hou, Yuejin (Autor)
Autor Corporativo: SpringerLink (Online service)
Formato: Electrónico eBook
Idioma:Inglés
Publicado: London : Springer London : Imprint: Springer, 2011.
Edición:1st ed. 2011.
Colección:Springer Series in Reliability Engineering,
Temas:
Security systems.
Computational intelligence.
Electronics.
Optical materials.
Differential equations.
Security Science and Technology.
Computational Intelligence.
Electronics and Microelectronics, Instrumentation.
Optical Materials.
Differential Equations.
Acceso en línea:Texto Completo
Tabla de Contenidos:
  • 1. Introduction
  • 2. Development of Physics-based Modeling for ULSI Interconnections Failure Mechanisms: Electromigration and Stress Induced Voiding
  • 3. Introduction and General Theory of Finite Element Method
  • 4. Finite Element Method for Electromigration Study
  • 5. Finite Element Method for Stress Induced Voiding
  • 6. Finite Element Method for Dielectric Reliability.

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