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Emerging Nanotechnologies Test, Defect Tolerance, and Reliability /
Emerging Nanotechnologies: Test, Defect Tolerance and Reliability covers various technologies that have been developing over the last decades such as chemically assembled electronic nanotechnology, Quantum-dot Cellular Automata (QCA), and nanowires and carbon nanotubes. Each of these technologies of...
| Clasificación: | Libro Electrónico |
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| Autor Corporativo: | |
| Otros Autores: | |
| Formato: | Electrónico eBook |
| Idioma: | Inglés |
| Publicado: |
New York, NY :
Springer US : Imprint: Springer,
2008.
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| Edición: | 1st ed. 2008. |
| Colección: | Frontiers in Electronic Testing ;
37 |
| Temas: | |
| Acceso en línea: | Texto Completo |
Tabla de Contenidos:
- Test and Defect Tolerance for Crossbar-Based Architectures
- Defect-Tolerant Logic with Nanoscale Crossbar Circuits
- Built-in Self-Test and Defect Tolerance in Molecular Electronics-Based Nanofabrics
- Test and Defect Tolerance for Reconfigurable Nanoscale Devices
- A Built-In Self-Test and Diagnosis Strategy for Chemically-Assembled Electronic Nanotechnology
- Defect Tolerance in Crossbar Array Nano-Architectures
- Test and Defect Tolerance for QCA Circuits
- Reversible and Testable Circuits for Molecular QCA Design
- Cellular Array-Based Delay-Insensitive Asynchronous Circuits Design and Test for Nanocomputing Systems
- QCA Circuits for Robust Coplanar Crossing
- Reliability and Defect Tolerance in Metallic Quantum-Dot Cellular Automata
- Testing Microfluidic Biochips
- Test Planning and Test Resource Optimization for Droplet-Based Microfluidic Systems
- Testing and Diagnosis of Realistic Defects in Digital Microfluidic Biochips
- Reliability for Nanotechnology Devices
- Designing Nanoscale Logic Circuits Based on Principles of Markov Random Fields
- Towards Nanoelectronics Processor Architectures
- Design and Analysis of Fault-Tolerant Molecular Computing Systems.