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Emerging Nanotechnologies Test, Defect Tolerance, and Reliability /
Emerging Nanotechnologies: Test, Defect Tolerance and Reliability covers various technologies that have been developing over the last decades such as chemically assembled electronic nanotechnology, Quantum-dot Cellular Automata (QCA), and nanowires and carbon nanotubes. Each of these technologies of...
| Clasificación: | Libro Electrónico |
|---|---|
| Autor Corporativo: | |
| Otros Autores: | |
| Formato: | Electrónico eBook |
| Idioma: | Inglés |
| Publicado: |
New York, NY :
Springer US : Imprint: Springer,
2008.
|
| Edición: | 1st ed. 2008. |
| Colección: | Frontiers in Electronic Testing ;
37 |
| Temas: | |
| Acceso en línea: | Texto Completo |
MARC
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| 024 | 7 | |a 10.1007/978-0-387-74747-7 |2 doi | |
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| 245 | 1 | 0 | |a Emerging Nanotechnologies |h [electronic resource] : |b Test, Defect Tolerance, and Reliability / |c edited by Mohammad Tehranipoor. |
| 250 | |a 1st ed. 2008. | ||
| 264 | 1 | |a New York, NY : |b Springer US : |b Imprint: Springer, |c 2008. | |
| 300 | |a XII, 408 p. 200 illus. |b online resource. | ||
| 336 | |a text |b txt |2 rdacontent | ||
| 337 | |a computer |b c |2 rdamedia | ||
| 338 | |a online resource |b cr |2 rdacarrier | ||
| 347 | |a text file |b PDF |2 rda | ||
| 490 | 1 | |a Frontiers in Electronic Testing ; |v 37 | |
| 505 | 0 | |a Test and Defect Tolerance for Crossbar-Based Architectures -- Defect-Tolerant Logic with Nanoscale Crossbar Circuits -- Built-in Self-Test and Defect Tolerance in Molecular Electronics-Based Nanofabrics -- Test and Defect Tolerance for Reconfigurable Nanoscale Devices -- A Built-In Self-Test and Diagnosis Strategy for Chemically-Assembled Electronic Nanotechnology -- Defect Tolerance in Crossbar Array Nano-Architectures -- Test and Defect Tolerance for QCA Circuits -- Reversible and Testable Circuits for Molecular QCA Design -- Cellular Array-Based Delay-Insensitive Asynchronous Circuits Design and Test for Nanocomputing Systems -- QCA Circuits for Robust Coplanar Crossing -- Reliability and Defect Tolerance in Metallic Quantum-Dot Cellular Automata -- Testing Microfluidic Biochips -- Test Planning and Test Resource Optimization for Droplet-Based Microfluidic Systems -- Testing and Diagnosis of Realistic Defects in Digital Microfluidic Biochips -- Reliability for Nanotechnology Devices -- Designing Nanoscale Logic Circuits Based on Principles of Markov Random Fields -- Towards Nanoelectronics Processor Architectures -- Design and Analysis of Fault-Tolerant Molecular Computing Systems. | |
| 520 | |a Emerging Nanotechnologies: Test, Defect Tolerance and Reliability covers various technologies that have been developing over the last decades such as chemically assembled electronic nanotechnology, Quantum-dot Cellular Automata (QCA), and nanowires and carbon nanotubes. Each of these technologies offers various advantages and disadvantages. Some suffer from high power, some work in very low temperatures and some others need indeterministic bottom-up assembly. These emerging technologies are not considered as a direct replacement for CMOS technology and may require a completely new architecture to achieve their functionality. Emerging Nanotechnologies: Test, Defect Tolerance and Reliability brings all of these issues together in one place for readers and researchers who are interested in this rapidly changing field. | ||
| 650 | 0 | |a Electronic circuits. | |
| 650 | 0 | |a Electronics. | |
| 650 | 0 | |a Nanotechnology. | |
| 650 | 0 | |a Security systems. | |
| 650 | 0 | |a Electrical engineering. | |
| 650 | 1 | 4 | |a Electronic Circuits and Systems. |
| 650 | 2 | 4 | |a Electronics and Microelectronics, Instrumentation. |
| 650 | 2 | 4 | |a Nanotechnology. |
| 650 | 2 | 4 | |a Security Science and Technology. |
| 650 | 2 | 4 | |a Electrical and Electronic Engineering. |
| 700 | 1 | |a Tehranipoor, Mohammad. |e editor. |4 edt |4 http://id.loc.gov/vocabulary/relators/edt | |
| 710 | 2 | |a SpringerLink (Online service) | |
| 773 | 0 | |t Springer Nature eBook | |
| 776 | 0 | 8 | |i Printed edition: |z 9780387520995 |
| 776 | 0 | 8 | |i Printed edition: |z 9781441945136 |
| 776 | 0 | 8 | |i Printed edition: |z 9780387747460 |
| 830 | 0 | |a Frontiers in Electronic Testing ; |v 37 | |
| 856 | 4 | 0 | |u https://doi.uam.elogim.com/10.1007/978-0-387-74747-7 |z Texto Completo |
| 912 | |a ZDB-2-ENG | ||
| 912 | |a ZDB-2-SXE | ||
| 950 | |a Engineering (SpringerNature-11647) | ||
| 950 | |a Engineering (R0) (SpringerNature-43712) | ||