Silicon Devices and Process Integration Deep Submicron and Nano-Scale Technologies /

Silicon Devices and Process Integration is compiled from industrial and academic lecture notes and reflects years of experience in the development of silicon devices. It is prepared specifically for engineers and scientists in semiconductor research, development and manufacturing. It is also suitabl...

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Detalles Bibliográficos
Clasificación:Libro Electrónico
Autor principal: El-Kareh, Badih (Autor)
Autor Corporativo: SpringerLink (Online service)
Formato: Electrónico eBook
Idioma:Inglés
Publicado: New York, NY : Springer US : Imprint: Springer, 2009.
Edición:1st ed. 2009.
Temas:
Electronic circuits.
Electronics.
Electrical engineering.
Materials science.
Electronic Circuits and Systems.
Electronics and Microelectronics, Instrumentation.
Electrical and Electronic Engineering.
Materials Science.
Acceso en línea:Texto Completo
Tabla de Contenidos:
  • Properties of the Silicon Crystal. Valence-bond and energy-band models. Thermal equilibrium statistics. Carrier transport mechanisms. Non-equilibrium conditions and carrier lifetime
  • Junctions and Contacts. Ohmic, non-ohmic, and rectifying contacts. PN junctions, homo- and hetero-junctions. Contact und junction characterization, parameter extraction. Varactors
  • Junction Field-Effect Transistor, JFET. Structure and mode of operation. Physics of JFET. JFET characterization and parameter extraction. High-voltage applications. Parasitic effects
  • Bipolar Junction Transistor, BJT. Structure and mode of operation. Physics of BJT. Heterojunction Bipolar Transistor, HBT. Transistor characterization and parameter extraction. High-voltage applications
  • Parasitic effects.

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