Scanning Microscopy for Nanotechnology Techniques and Applications /

Scanning electron microscopy (SEM) can be exploited not only for nanomaterials characterization but also integrated with new technologies for in-situ nanomaterials engineering and manipulation. Scanning Microscopy for Nanotechnology addresses the rapid development of these techniques for nanotechnol...

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Detalles Bibliográficos
Clasificación:Libro Electrónico
Autor Corporativo: SpringerLink (Online service)
Otros Autores: Zhou, Weilie (Editor ), Wang, Zhong Lin (Editor )
Formato: Electrónico eBook
Idioma:Inglés
Publicado: New York, NY : Springer New York : Imprint: Springer, 2007.
Edición:1st ed. 2007.
Temas:
Nanotechnology.
Materials-Analysis.
Optical materials.
Measurement.
Measuring instruments.
Characterization and Analytical Technique.
Optical Materials.
Measurement Science and Instrumentation.
Acceso en línea:Texto Completo
Tabla de Contenidos:
  • Fundamentals of Scanning Electron Microscopy (SEM)
  • Backscattering Detector and EBSD in Nanomaterials Characterization
  • X-ray Microanalysis in Nanomaterials
  • Low kV Scanning Electron Microscopy
  • E-beam Nanolithography Integrated with Scanning Electron Microscope
  • Scanning Transmission Electron Microscopy for Nanostructure Characterization
  • to In-Situ Nanomanipulation for Nanomaterials Engineering
  • Applications of FIB and DualBeam for Nanofabrication
  • Nanowires and Carbon Nanotubes
  • Photonic Crystals and Devices
  • Nanoparticles and Colloidal Self-assembly
  • Nano-building Blocks Fabricated through Templates
  • One-dimensional Wurtzite Semiconducting Nanostructures
  • Bio-inspired Nanomaterials
  • Cryo-Temperature Stages in Nanostructural Research.

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