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Scanning Microscopy for Nanotechnology Techniques and Applications /
Scanning electron microscopy (SEM) can be exploited not only for nanomaterials characterization but also integrated with new technologies for in-situ nanomaterials engineering and manipulation. Scanning Microscopy for Nanotechnology addresses the rapid development of these techniques for nanotechnol...
| Clasificación: | Libro Electrónico |
|---|---|
| Autor Corporativo: | |
| Otros Autores: | , |
| Formato: | Electrónico eBook |
| Idioma: | Inglés |
| Publicado: |
New York, NY :
Springer New York : Imprint: Springer,
2007.
|
| Edición: | 1st ed. 2007. |
| Temas: | |
| Acceso en línea: | Texto Completo |
MARC
| LEADER | 00000nam a22000005i 4500 | ||
|---|---|---|---|
| 001 | 978-0-387-39620-0 | ||
| 003 | DE-He213 | ||
| 005 | 20220116010355.0 | ||
| 007 | cr nn 008mamaa | ||
| 008 | 100301s2007 xxu| s |||| 0|eng d | ||
| 020 | |a 9780387396200 |9 978-0-387-39620-0 | ||
| 024 | 7 | |a 10.1007/978-0-387-39620-0 |2 doi | |
| 050 | 4 | |a T174.7 | |
| 050 | 4 | |a TA418.9.N35 | |
| 072 | 7 | |a TBN |2 bicssc | |
| 072 | 7 | |a TEC027000 |2 bisacsh | |
| 072 | 7 | |a TBN |2 thema | |
| 082 | 0 | 4 | |a 620.5 |2 23 |
| 245 | 1 | 0 | |a Scanning Microscopy for Nanotechnology |h [electronic resource] : |b Techniques and Applications / |c edited by Weilie Zhou, Zhong Lin Wang. |
| 250 | |a 1st ed. 2007. | ||
| 264 | 1 | |a New York, NY : |b Springer New York : |b Imprint: Springer, |c 2007. | |
| 300 | |a XIV, 522 p. 399 illus. |b online resource. | ||
| 336 | |a text |b txt |2 rdacontent | ||
| 337 | |a computer |b c |2 rdamedia | ||
| 338 | |a online resource |b cr |2 rdacarrier | ||
| 347 | |a text file |b PDF |2 rda | ||
| 505 | 0 | |a Fundamentals of Scanning Electron Microscopy (SEM) -- Backscattering Detector and EBSD in Nanomaterials Characterization -- X-ray Microanalysis in Nanomaterials -- Low kV Scanning Electron Microscopy -- E-beam Nanolithography Integrated with Scanning Electron Microscope -- Scanning Transmission Electron Microscopy for Nanostructure Characterization -- to In-Situ Nanomanipulation for Nanomaterials Engineering -- Applications of FIB and DualBeam for Nanofabrication -- Nanowires and Carbon Nanotubes -- Photonic Crystals and Devices -- Nanoparticles and Colloidal Self-assembly -- Nano-building Blocks Fabricated through Templates -- One-dimensional Wurtzite Semiconducting Nanostructures -- Bio-inspired Nanomaterials -- Cryo-Temperature Stages in Nanostructural Research. | |
| 520 | |a Scanning electron microscopy (SEM) can be exploited not only for nanomaterials characterization but also integrated with new technologies for in-situ nanomaterials engineering and manipulation. Scanning Microscopy for Nanotechnology addresses the rapid development of these techniques for nanotechnology, in both technique and application chapters by leading practitioners. The book covers topics including nanomaterials imaging, X-ray microanalysis, high-resolution SEM, low kV SEM, cryo-SEM, as well as new techniques such as electron back scatter diffraction (EBSD) and scanning transmission electron microscopy (STEM). Fabrication techniques integrated with SEM, such as e-beam nanolithography, nanomanipulation, and focused ion beam nanofabrication, are major new dimensions for SEM application. Application areas include the study of nanoparticles, nanowires and nanotubes, three-dimensional nanostructures, quantum dots, magnetic nanomaterials, photonic structures, and bio-inspired nanomaterials. This book will appeal not only to a broad spectrum of nanomaterials researchers, but also to SEM development specialists. | ||
| 650 | 0 | |a Nanotechnology. | |
| 650 | 0 | |a Materials-Analysis. | |
| 650 | 0 | |a Optical materials. | |
| 650 | 0 | |a Measurement. | |
| 650 | 0 | |a Measuring instruments. | |
| 650 | 1 | 4 | |a Nanotechnology. |
| 650 | 2 | 4 | |a Characterization and Analytical Technique. |
| 650 | 2 | 4 | |a Optical Materials. |
| 650 | 2 | 4 | |a Measurement Science and Instrumentation. |
| 700 | 1 | |a Zhou, Weilie. |e editor. |4 edt |4 http://id.loc.gov/vocabulary/relators/edt | |
| 700 | 1 | |a Wang, Zhong Lin. |e editor. |4 edt |4 http://id.loc.gov/vocabulary/relators/edt | |
| 710 | 2 | |a SpringerLink (Online service) | |
| 773 | 0 | |t Springer Nature eBook | |
| 776 | 0 | 8 | |i Printed edition: |z 9780387513140 |
| 776 | 0 | 8 | |i Printed edition: |z 9781441922090 |
| 776 | 0 | 8 | |i Printed edition: |z 9780387333250 |
| 856 | 4 | 0 | |u https://doi.uam.elogim.com/10.1007/978-0-387-39620-0 |z Texto Completo |
| 912 | |a ZDB-2-CMS | ||
| 912 | |a ZDB-2-SXC | ||
| 950 | |a Chemistry and Materials Science (SpringerNature-11644) | ||
| 950 | |a Chemistry and Material Science (R0) (SpringerNature-43709) | ||