Cargando…

Advances in Electronic Testing Challenges and Methodologies /

Advances in Electronic Testing: Challenges and Methodologies is a new type of edited volume in the Frontiers in Electronic Testing book series devoted to recent advances in electronic circuits testing. The book is a comprehensive elaboration on important topics which capture major research and devel...

Descripción completa

Detalles Bibliográficos
Clasificación:Libro Electrónico
Autor Corporativo: SpringerLink (Online service)
Otros Autores: Gizopoulos, Dimitris (Editor )
Formato: Electrónico eBook
Idioma:Inglés
Publicado: New York, NY : Springer US : Imprint: Springer, 2006.
Edición:1st ed. 2006.
Colección:Frontiers in Electronic Testing ; 27
Temas:
Acceso en línea:Texto Completo
Tabla de Contenidos:
  • Defect-Orinted Testing
  • Failure Mechanisms and Testing in Nanometer Technologies
  • Silicon Debug
  • Delay Testing
  • High-Speed Digital Test Interfaces
  • DFT_Oriented,Low-Cost Testers
  • Embedded Cores and System-on-Chip Testing
  • Embedded MemoryTesting
  • Mixed-Signal Testing and DfT
  • RF Testing
  • Loaded Board Testing.