Advances in Electronic Testing Challenges and Methodologies /
Advances in Electronic Testing: Challenges and Methodologies is a new type of edited volume in the Frontiers in Electronic Testing book series devoted to recent advances in electronic circuits testing. The book is a comprehensive elaboration on important topics which capture major research and devel...
Clasificación: | Libro Electrónico |
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Autor Corporativo: | |
Otros Autores: | |
Formato: | Electrónico eBook |
Idioma: | Inglés |
Publicado: |
New York, NY :
Springer US : Imprint: Springer,
2006.
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Edición: | 1st ed. 2006. |
Colección: | Frontiers in Electronic Testing ;
27 |
Temas: | |
Acceso en línea: | Texto Completo |
Tabla de Contenidos:
- Defect-Orinted Testing
- Failure Mechanisms and Testing in Nanometer Technologies
- Silicon Debug
- Delay Testing
- High-Speed Digital Test Interfaces
- DFT_Oriented,Low-Cost Testers
- Embedded Cores and System-on-Chip Testing
- Embedded MemoryTesting
- Mixed-Signal Testing and DfT
- RF Testing
- Loaded Board Testing.