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Leakage in Nanometer CMOS Technologies

Scaling transistors into the nanometer regime has resulted in a dramatic increase in MOS leakage (i.e., off-state) current. Threshold voltages of transistors have scaled to maintain performance at reduced power supply voltages. Leakage current has become a major portion of the total power consumptio...

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Detalles Bibliográficos
Clasificación:Libro Electrónico
Autor Corporativo: SpringerLink (Online service)
Otros Autores: Narendra, Siva G. (Editor ), Chandrakasan, Anantha P. (Editor )
Formato: Electrónico eBook
Idioma:Inglés
Publicado: New York, NY : Springer US : Imprint: Springer, 2006.
Edición:1st ed. 2006.
Colección:Integrated Circuits and Systems,
Temas:
Acceso en línea:Texto Completo

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