Data Mining and Diagnosing IC Fails

Datamining and Diagnosing Integrated Circuit Fails addresses the problem of obtaining maximum information from (functional) Integrated Circuit fail data about the defects that caused the fails. It starts at the highest level from mere sort codes, and drills down via various data mining techniques to...

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Detalles Bibliográficos
Clasificación:Libro Electrónico
Autor principal: Huisman, Leendert M. (Autor)
Autor Corporativo: SpringerLink (Online service)
Formato: Electrónico eBook
Idioma:Inglés
Publicado: New York, NY : Springer US : Imprint: Springer, 2005.
Edición:1st ed. 2005.
Colección:Frontiers in Electronic Testing ; 31
Temas:
Electronic circuits.
Electronics.
Electronic Circuits and Systems.
Electronics and Microelectronics, Instrumentation.
Acceso en línea:Texto Completo
Tabla de Contenidos:
  • Introduction
  • Statistics
  • Yield Statistics
  • Area Dependence of the Yield
  • Statistics of Embedded Object Fails
  • Fail Commonalities
  • Spatial Patterns
  • Test Coverage and Test Fallout
  • Logic Diagnosis
  • Slat Based Diagnosis
  • Data Collection Requirements
  • Appendix A. Distribution of IC Fails
  • Appendix B. General Yield Model
  • Appendix C. Simplified Center-Satellite Model
  • Appendix D. Quadrat Analysis
  • Appendix E. Cell Fail Probabilities
  • Appendix F. Characterization Group
  • Appendix G. Component Fail Probabilities
  • Appendix H. Yield and Coverage
  • Appendix I. Estimating First Fail Probabilities from the Fallout
  • Appendix J. Identity of M and S
  • References
  • Index.

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