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Data Mining and Diagnosing IC Fails
Datamining and Diagnosing Integrated Circuit Fails addresses the problem of obtaining maximum information from (functional) Integrated Circuit fail data about the defects that caused the fails. It starts at the highest level from mere sort codes, and drills down via various data mining techniques to...
| Clasificación: | Libro Electrónico |
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| Autor principal: | |
| Autor Corporativo: | |
| Formato: | Electrónico eBook |
| Idioma: | Inglés |
| Publicado: |
New York, NY :
Springer US : Imprint: Springer,
2005.
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| Edición: | 1st ed. 2005. |
| Colección: | Frontiers in Electronic Testing ;
31 |
| Temas: | |
| Acceso en línea: | Texto Completo |