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Physical Principles of Electron Microscopy An Introduction to TEM, SEM, and AEM /
Scanning and stationary-beam electron microscopes have become an indispensable tool for both research and routine evaluation in materials science, the semiconductor industry, nanotechnology, and the biological and medical sciences. Physical Principles of Electron Microscopy provides an introduction...
| Clasificación: | Libro Electrónico |
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| Autor principal: | |
| Autor Corporativo: | |
| Formato: | Electrónico eBook |
| Idioma: | Inglés |
| Publicado: |
New York, NY :
Springer US : Imprint: Springer,
2005.
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| Edición: | 1st ed. 2005. |
| Temas: | |
| Acceso en línea: | Texto Completo |
Tabla de Contenidos:
- An Introduction to Microscopy
- Electron Optics
- The Transmission Electron Microscope
- TEM Specimens and Images
- The Scanning Electron Microscope
- Analytical Electron Microscopy
- Recent Developments.