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Introduction to Advanced System-on-Chip Test Design and Optimization
SOC test design and its optimization is the topic of Introduction to Advanced System-on-Chip Test Design and Optimization. It gives an introduction to testing, describes the problems related to SOC testing, discusses the modeling granularity and the implementation into EDA (electronic design automat...
| Clasificación: | Libro Electrónico |
|---|---|
| Autor principal: | |
| Autor Corporativo: | |
| Formato: | Electrónico eBook |
| Idioma: | Inglés |
| Publicado: |
New York, NY :
Springer US : Imprint: Springer,
2005.
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| Edición: | 1st ed. 2005. |
| Colección: | Frontiers in Electronic Testing ;
29 |
| Temas: | |
| Acceso en línea: | Texto Completo |
Tabla de Contenidos:
- Testing Concepts
- Design Flow
- Design for Test
- Boundary Scan
- SOC Design for Testability
- System Modeling
- Test Conflicts
- Test Power Dissipation
- Test Access Mechanism
- Test Scheduling
- SOC Test Applications
- A Reconfigurable Power-Conscious Core Wrapper and its Application to System-on-Chip Test Scheduling
- An Integrated Framework for the Design and Optimization of SOC Test Solutions
- Efficient Test Solutions for Core-Based Designs
- Core Selection in the SOC Test Design-Flow
- Defect-Aware Test Scheduling
- An Integrated Technique for Test Vector Selection and Test Scheduling under ATE Memory Depth Constraint.