Matching Properties of Deep Sub-Micron MOS Transistors

Matching Properties of Deep Sub-Micron MOS Transistors examines this interesting phenomenon. Microscopic fluctuations cause stochastic parameter fluctuations that affect the accuracy of the MOSFET. For analog circuits this determines the trade-off between speed, power, accuracy and yield. Furthermor...

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Detalles Bibliográficos
Clasificación:Libro Electrónico
Autores principales: Croon, Jeroen A. (Autor), Sansen, Willy M. (Autor), Maes, Herman E. (Autor)
Autor Corporativo: SpringerLink (Online service)
Formato: Electrónico eBook
Idioma:Inglés
Publicado: New York, NY : Springer US : Imprint: Springer, 2005.
Edición:1st ed. 2005.
Colección:The Springer International Series in Engineering and Computer Science ; 851
Temas:
Electronic circuits.
Physics.
Astronomy.
Electronics.
Engineering.
Electrical engineering.
Electronic Circuits and Systems.
Physics and Astronomy.
Electronics and Microelectronics, Instrumentation.
Technology and Engineering.
Electrical and Electronic Engineering.
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