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Characterization of semiconductor heterostructures and nanostructures /
Characterization of Semiconductor Heterostructures and Nanostructures is structured in chapters, each one devoted to a specific characterization technique used in the understanding of the properties (structural, physical, chemical, electrical etc..) of semiconductor quantum wells and superlattices....
| Clasificación: | QC176.8 N3.5 Ch3.72 |
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| Otros Autores: | |
| Formato: | Libro |
| Idioma: | Inglés |
| Publicado: |
Amsterdam ; Oxford :
Elsevier,
2008.
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| Edición: | 1st ed. |
| Temas: |
Tabla de Contenidos:
- Introduction: the interdisciplinary nature of nanotechnology and its need to exploit frontier characterization techniques / Carlo Lamberti
- Ab initio studies of structural and electronic properties / Maria Peressi, Alfonso Baldereschi, and Stefano Baroni
- Electrical characterization of nanostructures / Anna Cavallini and Laura Polenta
- Strain and composition determination in semiconducting heterostructures by high-resolution X-ray diffraction / Claudio Ferrari and Claudio Bocchi
- Transmission electron microscopy techniques for imaging and compositional evaluation in semiconductor heterostructures / Laura Lazzarini, Lucia Nasi, and Vincenzo Grillo
- Accessing structural and electronic properties of semiconductor nanostructures via photoluminescence / Stefano Sanguinetti, Mario Guzzi, and Massimo Gurioli
- Power-dependent cathodoluminescence in III-nitrides heterostructures: from internal field screening to controlled band-gap modulation / Giancarlo Salviati, Francesca Rossi, Nicola Armani, Vincenzo Grillo, and Laura Lazzarini
- Raman spectroscopy / Daniel Wolverson
- X-ray absorption fine structure in the study of semiconductor heterostructures and nanostructures / Federico Boscherini
- Nanostructures in the light of synchrotron radiation: surface-sensitive X-ray techniques and anomalous scattering / Till Metzger, Vincent Favre-Nicolin, Gilles Renaud, Hubert Renevier, and Tobias Schülli
- Grazing incidence diffraction anomalous fine structure in the study of structural properties of nanostructures / Maria Grazia Proietti, Johann Coraux, and Hubert Renevier
- The role of photoemission spectroscopies in heterojunction research / Giorgio Margaritondo
- ESR of interfaces and nanolayers in semiconductor heterostructures / Andre Stesmans and Valery V. Afanas§ev.