Characterization of semiconductor heterostructures and nanostructures /
Characterization of Semiconductor Heterostructures and Nanostructures is structured in chapters, each one devoted to a specific characterization technique used in the understanding of the properties (structural, physical, chemical, electrical etc.) of semiconductor quantum wells and superlattices. A...
Clasificación: | QC176.8 N3.5 C3.72 |
---|---|
Otros Autores: | , , , , |
Formato: | Libro |
Idioma: | Inglés |
Publicado: |
Amsterdam ; Oxford :
Elsevier,
[2008].
|
Edición: | First edition. |
Temas: |
Tabla de Contenidos:
- Chapter 1. Introduction: the interdisciplinary nature of nanotechnology and its need to exploit frontier characterization techniques / Carlo Lamberti.
- Chapter 2. Ab initio studies of structural and electronic properties / Maria Peressi.
- Alfonso Baldereschi.
- Stefano Baroni.
- Chapter 3. Electrical characterization of nanostructures / Anna Cavallini.
- Laura Polenta.
- Chapter 4. Strain and composition determination in semiconducting heterostructures by high-resolution X-ray diffraction / Claudio Ferrari.
- Claudio Bocchi.
- Chapter 5. Transmission electron microscopy techniques for imaging and compositional evaluation in semiconductor heterostructures / Laura Lazzarini.
- Lucia Nasi.
- Vincenzo Grillo.
- Chapter 6. Accessing structural and electronic properties of semiconductor nanostructures via photoluminescence / Stefano Sanguinetti.
- Mario Guzzi.
- Massimo Gurioli.
- Chapter 7. Power-dependent cathodoluminescence in III-nitrides heterostructures: from internal field screening to controlled band-gap modulation / Giancarlo Salviati.
- Francesca Rossi.
- Nicola Armani.
- Vincenzo Grillo.
- Laura Lazzarini.
- Chapter 8. Raman spectroscopy / Daniel Wolverson.
- Chapter 9. X-ray absorption fine structure in the study of semiconductor heterostructures and nanostructures / Federico Boscherini.
- Chapter 10. Nanostructures in the light of synchrotron radiation: surface-sensitive X-ray techniques and anomalous scattering / Till Metzger.
- Vincent Favre-Nicolin.
- Gilles Renaud.
- Hubert Renevier.
- Tobias Schülli.