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    C, H, N and O in Si and Characterization and Simulation of Materials and Processes : Proceedings of Symposium N and Symposium G of the 1995 E-Mrs Spring Conference, Held in Strasbourg, France, 22-26 May 1995 /
    Publicado 1996
    “…Symposium G on Atomic Scale Characterization and Simulation of Materials and Processes…”
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    Electrónico Congresos, conferencias eBook